Hioki UA1781 System tworzenia danych inspekcji

SYSTEM TWORZENIA DANYCH INSPEKCJI FEB-LINE

Cut Data Generation Time in Half With New Platform FEB-LINE UA1781

[F]lying probe test for [E]mbedded and [B]are boards = FEB-LINE

3-in-1 Editing Software for Bare Board Testing

Leverages the Hioki Know-how for Substrate Testing

Also supports complex circuit structures built into components with the element synthesis command. Automatically calculate the RLC serial parallel status of the built-in components to calculate the measurement theory value using measurement points. It is also possible to calculate the minimum combination that can measure all components.

Recommended for cavity substrates

Easily generate test points (probing points) anywhere you like, in addition to those created automatically. Create test points on the top surface, bottom surface, and even on the inner layer for cavity structures with just a single click.

Expanded touch panel functions for printed boards

Interlayer automatic connections. Even in touch panels, ceramic substrates, or other printed circuit board data in which non-conductive layers are combined, vias are automatically connected based on the overlapping of conduction layers to perform net generation. DXF entry support makes line connection and paint/blank processing easy too.